VC20™

Probe card solution for a wide variety of tests

  • 20mm diameter ceramic probe card core
  • Optimized for DC parametric test, modeling and characterization, and single site WLR
  • Can be quickly installed using an interface tool into various interfaces and takes minimal storage space on the test floor
  • Can be configured with up to 48 probes
  • Channel-to-channel Leakage < 5fA/V @10seconds and 25°C
  • Temperature range -65°C to +200°C continuous
  • Standard X/Y accuracy 10% pad size
  • Standard Z accuracy +/- 5 microns

The 20mm VC20™ with Advanced Cantilever™ technology is a highly adaptable probe card solution for a wide variety of tests including Modeling & Characterization, Wafer Level Reliability or Parametric Test. It can be easily combined with different interfaces to create modular probe cards supporting Keithley, Keysight or other custom tester platforms.

  • Modular
    Interchangeable probe card, universal motherboards
  • Fast changeover time
    from one probe card to the next using an insertion tool
  • Or automated
    Indexer TM can support up to five VC20 TM with Advanced CantileverTM technology cores
  • Customizable PCB
    Integrated into VC20 TM with Advanced CantileverTM technology Probecard to support resistor IDs, capacitors, inductors, EEProms only 12mm from probe tips

zurück

Leider sind externe Einbindungen ohne entsprechende Cookies Zustimmung nicht verfügbar. Cookie Einstellungen bearbeiten