Probe card solution for a wide variety of tests

  • 20mm diameter ceramic probe card core
  • Optimized for DC parametric test, modeling and characterization, and single site WLR
  • Can be quickly installed using an interface tool into various interfaces and takes minimal storage space on the test floor
  • Can be configured with up to 48 probes
  • Channel-to-channel Leakage < 5fA/V @10seconds and 25°C
  • Temperature range -65°C to +200°C continuous
  • Standard X/Y accuracy 10% pad size
  • Standard Z accuracy +/- 5 microns

The 20mm VC20™ with Advanced Cantilever™ technology is a highly adaptable probe card solution for a wide variety of tests including Modeling & Characterization, Wafer Level Reliability or Parametric Test. It can be easily combined with different interfaces to create modular probe cards supporting Keithley, Keysight or other custom tester platforms.

  • Modular
    Interchangeable probe card, universal motherboards
  • Fast changeover time
    from one probe card to the next using an insertion tool
  • Or automated
    Indexer TM can support up to five VC20 TM with Advanced CantileverTM technology cores
  • Customizable PCB
    Integrated into VC20 TM with Advanced CantileverTM technology Probecard to support resistor IDs, capacitors, inductors, EEProms only 12mm from probe tips

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