T90™
Designed for mounting on a standard 4.5″ probe card holder for multi-site wafer level reliability testing
- 90 millimeter ceramic probe card
- Optimized for multi-site DC parametric test and multi-site WLR
- Compatible with standard 4.5″ rectangular edge card holders
- Several Connector options available
- Compatible with quick disconnect Celadon triax cable harnesses
- Temperature compensated for use from -65°C to 300°C
- fA level leakage measurements
- Quasi-Kelvin connections available
T90™ with Advanced Cantilever™ technology Series Probe Card The 90 mm tile was designed for mounting on a standard 4.5″ probe card holder for multi-site wafer level reliability testing. The 1.6 mm (0.062″) thick rails allow the chassis to slip into planarity adjustable probe card holders for most analytical probe stations.
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