T90™

Designed for mounting on a standard 4.5″ probe card holder for multi-site wafer level reliability testing

  • 90 millimeter ceramic probe card
  • Optimized for multi-site DC parametric test and multi-site WLR
  • Compatible with standard 4.5″ rectangular edge card holders
  • Several Connector options available
  • Compatible with quick disconnect Celadon triax cable harnesses
  • Temperature compensated for use from -65°C to 300°C
  • fA level leakage measurements
  • Quasi-Kelvin connections available

T90™ with Advanced Cantilever™ technology Series Probe Card The 90 mm tile was designed for mounting on a standard 4.5″ probe card holder for multi-site wafer level reliability testing. The 1.6 mm (0.062″) thick rails allow the chassis to slip into planarity adjustable probe card holders for most analytical probe stations.

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