T90™
Designed for mounting on a standard 4.5″ probe card holder for multi-site wafer level reliability testing
- 90 millimeter ceramic probe card
- Optimized for multi-site DC parametric test and multi-site WLR
- Compatible with standard 4.5″ rectangular edge card holders
- Several Connector options available
- Compatible with quick disconnect Celadon triax cable harnesses
- Temperature compensated for use from -65°C to 300°C
- fA level leakage measurements
- Quasi-Kelvin connections available
T90™ with Advanced Cantilever™ technology Series Probe Card The 90 mm tile was designed for mounting on a standard 4.5″ probe card holder for multi-site wafer level reliability testing. The 1.6 mm (0.062″) thick rails allow the chassis to slip into planarity adjustable probe card holders for most analytical probe stations.
Interessante Produkte
Quietest cables in the Industry. Get the most out of your probe card.
zum ProduktDesigned for long-term, multi-site, high-density wafer level reliability or burn-in tests up to 400°C
zum Produkt