T300 ButtonTile™
Designed for long-term, multi-site, high-density wafer level reliability or burn-in tests up to 400°C
The Celadon T300™ probe cards are designed for long-term, multi-site, high-density wafer level reliability or burn-in tests up to 400°C. In today’s economic environment, conventional reliability data is needed quickly while eliminating the cost, electrical stress, and delay of parts packaging while maintaining a wafer performance map.
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