VEGA Die Prober
High Performance Laser Dioden Probing Lösungen
VEGA DP80 & DP76
- A wide range of configuration options perfectly designed for testing VCSELs, EELs and packaged devices.
- Single die pickup from tape to tape
- Extremely fast probing and sorting cycle for reduced cost-of-test.
- Supports a broad range of temperatures ranging from high temperature to sub-zero testing.
- Multiple test stations for mounting optical components for LIV, Near Field, and Far Field testing.