VC20™
Probe card solution for a wide variety of tests
- 20mm diameter ceramic probe card core
- Optimized for DC parametric test, modeling and characterization, and single site WLR
- Can be quickly installed using an interface tool into various interfaces and takes minimal storage space on the test floor
- Can be configured with up to 48 probes
- Channel-to-channel Leakage < 5fA/V @10seconds and 25°C
- Temperature range -65°C to +200°C continuous
- Standard X/Y accuracy 10% pad size
- Standard Z accuracy +/- 5 microns
The 20mm VC20™ with Advanced Cantilever™ technology is a highly adaptable probe card solution for a wide variety of tests including Modeling & Characterization, Wafer Level Reliability or Parametric Test. It can be easily combined with different interfaces to create modular probe cards supporting Keithley, Keysight or other custom tester platforms.
- Modular
Interchangeable probe card, universal motherboards - Fast changeover time
from one probe card to the next using an insertion tool - Or automated
Indexer TM can support up to five VC20 TM with Advanced CantileverTM technology cores - Customizable PCB
Integrated into VC20 TM with Advanced CantileverTM technology Probecard to support resistor IDs, capacitors, inductors, EEProms only 12mm from probe tips
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Quietest cables in the Industry. Get the most out of your probe card.
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