T300 ButtonTile™

Designed for long-term, multi-site, high-density wafer level reliability or burn-in tests up to 400°C

Technische Daten
Downloads

300 millimeter ceramic button probe card
Optimized for multi-site WLR
For use with the Celadon Modular Adapter™
Temperature compensated for use from -65°C to 350°C (options to 400°C)
fA level leakage measurements

The Celadon T300™ probe cards are designed for long-term, multi-site, high-density wafer level reliability or burn-in tests up to 400°C. In today’s economic environment, conventional reliability data is needed quickly while eliminating the cost, electrical stress, and delay of parts packaging while maintaining a wafer performance map.

zurück