RF wafer probes convert the electro-magnetic energy travelling along the coaxial cables to the on-wafer DUT and its contact pads. The conversion has to be carried out with minimal distortions and energy loss.
There are significant differences between the various types of RF DUTs: from discrete elements to complex ICs operating at very wide frequency range. RF probe technology therefore must support a wide range of frequencies and pitches as well as the various tip configurations. Finally, the probe price together with the probe lifetime directly influences the DUT cost of test.
With a critical understanding of the numerous challenges associated with today’s RF applications, MPI Corporation has developed TITAN™ RF Probes, a product series specifically optimized for these complex applications centered upon the requirements of advanced RF customers. TITAN™ Probes provide the latest in technology and manufacturing advancements within the field of RF testing utilizing MPI’s proprietary world-class MEMS technology.