VEGA Top Prober

High Performance Laser Dioden Probing Lösungen


  • Extreme temperature test capability (-40˚ to +200˚C)
  • High performance loader system easily handles various device types such as thin/warped wafer, normal wafer, substrate, Packaged or other devices.
  • Multiple optics / detector choices to meet your exact needs to test LIV, Near Field, and Far Field optical characteristics.
  • Selectable contact mechanism options include Probe Card Holder (PCH), Wedge Probe Card and MPI F1 Single Probe Module achieving high precision measurement.
  • MPI SIRIUS prober control software provides comprehensive control functions from basic wafer alignment, mapping, probe mark inspection to the deployment of MPI’s advanced Needle Alignment Mechanism (NAM) technology.
  • The STARGAZER Photonics Test System features a user-centric design that can be flexibly configured and programmed according to your unique test requirements.


STARGAZER Photonics Test System
Flexibility: With support for multiple test recipes, the user can flexibly select or modify the workflow or edit parameters according to the product and tests being performed
Production Management: Manage lab/production data via the intuitive and easy-to-use software interface. Integrated real-time system monitoring and reporting enable a smooth and fully unattended test process
Seamless Integration: With MPI’s extensive instrument library, the STARGAZER test system can easily interface with mainstream third-party measurement instruments to meet your unique testing needs.


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