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MPI TS2000 Automated Wafer Probe System
MPI TS2000 is a natural evolution of the world-wide and well established LEDA Probe System with dedicated designs addressing Advanced Semiconductor Test market requirements.
The system is fully compatible with the all MPI system accessories and is designed primarily to address of Failure Analysis, Design Verification, IC engineering, Wafer Level Reliability as well as special requirements for MEMS, High Power, RF and mmW device testing.
Available for ambient and/or hot only temperature operation modes the TS2000 is fast with speed up to 10 Dies/second (depends on the final configuration), which makes it an ideal choice for pre-production electrical tests on discrete RF devices, as example.
TS2000 Series provides large, easily accessible probe platen in order to accommodate up to 12x DC or 4x RF MicroPositioners. Integration of Load-Pull Tuners or larger area MicroPositioners makes TS2000 system an ideal choice for RF and mmW measurements.
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