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The Element Series VC20 probe card is a highly adaptable solution for a wide variety of tests. Easily use the VC20 in different adapters, or quickly change probe cards for reconfigured wafer layouts in modeling & characterization, wafer level reliability, or parametric test.
The VC20 performs with the same ultra low leakage and high performance of Celadon’sstandard probe cards.
Low Leakage at 10 seconds:
- Leakage < 5 fA/V from -65 °C to 75 °C
- Leakage < 10 fA/V from 75 °C to 100 °C
- Leakage < 50 fA/V from 100 °C to 150 °C
- Leakage < 300 fA/V from 150 °C to 200 °C
- 45E interface makes VC20 probe card compatible with standard 4.5” holders
- 4080E interface makes VC20 probe carrd compatible with Agilent 408x testers
- Up to 48 single layer probes per card
- Minimum pitch pattern-dependent
- Standard X-Y accuracy 10 % pad size
- Standard Z accuracy +/- 5 microns
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