Tile-on-Card™ Probe Card

Production Multiprobe – Extreme Temperature Options available

The Celadon Tile-on-Card probe card is a low cost solution for various temperature ranges and ambient Device Testing, Modeling & Characterization or Wafer Level Reliability.

  • Benefiting from the Celadon patented Crash Resistant Ceramic Technology
  • Low maintenance and low cost of ownership through  long life
  • Supports multi-die testing for up to 200 probes
  • Supports various tester platforms

Tile On Card setup


Application Note

Imagine the ability to test 4/8/16 DUTs at once at 200°C for Automotive production test or multiple DUTs at 4K for Quantum Computing testing


What you can expect:

  • Increased throughput, exceptional probe card lifetime performance coupled with stability over Extreme Temperatures, Celadon’s TOC™ probe card leads the industry in performance and cost.
  • Celadon’s uniquely robust and repairable patented probe-in-ceramic crash resistant probe cards reduce maintenance headaches while increasing tester utilization.
  • Celadon’s TOC™ probe cards are known for achieving 10 Million+ touch downs before rebuild on test floors worldwide.
  • In addition to Semiconductor applications, Celadon’s TOC™s probe cards are chosen for production in Medical, Military and Space applications worldwide.
  • Celadon can design a PCB for a custom application, or even convert an existing epoxy ring card into a Celadon Tile-on-Card™.
  • With PCB materials and low-leakage expertise, Celadon can design a solution to fit any requirement.
  • The end result to expect with this product is low cost of test with superior test capability.

customized TOC

customized TOC I

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+49 351 2138640

Please contact us
Address: Heilbronner Str. 17, 01189 Dresden, Germany
Phone: +49 (0) 351 2138640
Fax: +49 (0) 351 2138650
E-Mail: atv@atv-systems.de
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First Contact in Measurement Technology

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