MPI @ European Microwave Week 2019 in Paris at Booth #770

MPI Corporation @ EuMW
1-3 October 2019
Porte de Versailles Paris, France
Booth #770

Your Local Sales Contact:
AutomatisierungsTechnik Voigt GmbH

Call us for making an appointment:

+49 351 2138640

 MPI Highlights @ EuMW 2019


TS2000-SE Configured with the New MPI THZ-Selection

MPI THZ-Selection converts TS2000-SE system into a dedicated, mmW and THz probe station, as the first one on the market

  • Automated testing of wafers up to 200 mm with unsurpassed measurement accuracy is possible now
  • The MPI THZ Selection incorporates MPI’s innovative design of frequency extender’s integration, which hovers the extender over the entire 200 mm wafer
  • This minimize the distance to the DUT to a minimum in order to provide best possible measurement directivity and accuracy



The New MPI ITS25-THZ New IMPACT™ Test Solution

Enabling cost effective mmW and THZ testing with the highest possible measurement accuracy

  •  ITS25-THZ is equipped with dedicated mmW chuck supporting probing of submillimeter-wave MMICs as small as 1 x 1 mm and up to 25 x 25 mm
  • The chuck is made completely by ceramics, and supports both the DUT and the calibration standards. Dielectric properties of the chuck material and its design are optimised to suppress possible propagation of higher-order modes providing accurate system calibration and trustable measurement results at THz frequencies
  • The set of MP80 MicroPositioners and unique integration of all types of frequency extenders available on the market is designed for direct wafer probe mount and eliminates the need for additional waveguide section. This solution guarantees the best possible measurement directivity of the system in the entire measurement frequency range of up to 1.5 THz



WaferWallet™: Fully-automatic Wafer Handling

Incorporates simple and convenient handling of multiple wafer types and sizes

  • Five individual trays for 150, 200, or 300 mm “modeling” wafers - No cassette handling, flexible set-ups, cost-effective automation
  • Fully-automated tests at different temperatures are possible - Increasing the test cell efficiency by 3x to 4x, faster time to market
  • Pre-Aligner, Wafer ID-Reader options - Automated 90 degree rotation and free notch orientation

 MPI’s WaferWallet™ extends the TS3500 series automation without compromising measurement capability




TITAN™ Multi-Contact Probe

TITAN™ MEMS tip-based probe for test of highly-integrated RF ICs

  •  Unique tip visibility, compact design - Easy to use, fast changeover in ShielDEnvironment™
  • Perfectly-aligned, impedance matched MEMS tips - Accurate measurement data
  • Ni tips with 20 µm tip width, short skate - Consistent test of Si devices and ICs with small pads

 Use Online Design Capture Form to build your probe by choosing RF signal (S),  logic (L) and power supply (P) channels according to your IC pad layout.





Unique RF Calibration Software

  • Multi-touch, multi-language, inside SENTIO® – Intuitive and easy to use
  • Automated NIST multiline TRL & proprietary TMR, TMRR methods  – On-wafer, metrology-level calibration in the lab
  • Free license for life, easy to upgrade – Reduce the cost of test, future compatibility guaranteed

For QAlibria®  registration, please click here.




TITAN™ RF Probes

  • Models from 26 GHz to 110 GHz; reduced contact for small pads



Please contact us
Address: Heilbronner Str. 17, 01189 Dresden, Germany
Phone: +49 (0) 351 2138640
Fax: +49 (0) 351 2138650
© 2020 AutomatisierungsTechnik Voigt GmbH
First Contact in Measurement Technology

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