FREE WEBINAR Test solutions for Silicon Photonics Device Characterisation
Topic: Test solutions for Silicon Photonics Device Characterisation
Tiny PIC's with Huge Impact: Meeting the Challenges of Photonic Integrated Circuits testing for next-generation networks
Date: June 17, 2020
Time: 11 am EDT | 4 pm GMT
Lawrence Van der Vegt, Subject Matter Expert @ EXFO
Ashkan Seyedi, Senior Research Scientist @ HPE
In this webinar, you will discover how the collaborative EXFO, HPE, and MPI PIC testing solution addresses market challenges, making wafer testing faster, scalable, and more reliable, ultimately improving speed-to-market for component manufacturers.