Tile-on-Card™

Low cost solution for lower temperature or ambient Device Testing, Modeling & Characterization or Wafer Level Reliability

  • Has all of the benefits of the Celadon patented Crash Resistant Ceramic Technology
  • Is known for very low maintenance, having a long life resulting in a low cost of ownership
  • Can support multi-die testing up to 200 probes
  • Can support various tester platform

Celadon’s uniquely robust and repairable patented probe-in-ceramic crash resistant probe cards reduce maintenance headaches while increasing tester utilization. Celadon’s TOC™ probe cards are known for achieving 10 million+ touch downs before rebuild on test floors worldwide.

The Celadon Tile-on-Card™ probe card is a low cost solution for lower temperature or ambient Device Testing, Modeling & Characterization or Wafer Level Reliability.

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